DocumentCode
722143
Title
Tradeoff of write-ability and erase-ability in overwrite
Author
Lin, E.E. ; Bai, D. ; Liu, F. ; Yuan, S.
Author_Institution
Western Digital, Fremont, CA, USA
fYear
2015
fDate
11-15 May 2015
Firstpage
1
Lastpage
1
Abstract
This study analyzes the impact of system´s write-ability and erase-ability on OVW. It characterizes OVW by breaking down writing and erasing processes and varying write stress, data patterns, and writer designs. Some generic OVW trends are characterized. It is also found that the impact of writer design on OVW can be emulated by changing writing stress.
Keywords
magnetic recording; data patterns; erase-ability; erasing process; generic overwrite trends; write-ability; writer designs; writing stress; Magnetic heads; Magnetic recording; Market research; Signal to noise ratio; Stress; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location
Beijing
Print_ISBN
978-1-4799-7321-7
Type
conf
DOI
10.1109/INTMAG.2015.7157464
Filename
7157464
Link To Document