DocumentCode
722147
Title
Pattern dependency of TMR sensor noise
Author
Venugopal, V. ; Wu, G. ; Stokes, S.
Author_Institution
Seagate Technol., Bloomington, MN, USA
fYear
2015
fDate
11-15 May 2015
Firstpage
1
Lastpage
1
Abstract
This article investigates the pattern dependence of tunnelling magnetoresistance sensor noise behavior to determine the characteristics and the source of noise in the read sensor. It is shown that the TMR sensor noise is dependent on the cross-field direction of the dc pattern and is also influenced by the poor magnetic field gradient of the writer.
Keywords
magnetic noise; magnetic sensors; magnetoresistive devices; tunnelling magnetoresistance; TMR sensor noise; dc pattern cross-field direction; magnetic field gradient; pattern dependence; read sensor; tunnelling magnetoresistance; Magnetic fields; Magnetic recording; Media; Noise; Noise measurement; Tunneling magnetoresistance; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location
Beijing
Print_ISBN
978-1-4799-7321-7
Type
conf
DOI
10.1109/INTMAG.2015.7157468
Filename
7157468
Link To Document