Title :
Pattern dependency of TMR sensor noise
Author :
Venugopal, V. ; Wu, G. ; Stokes, S.
Author_Institution :
Seagate Technol., Bloomington, MN, USA
Abstract :
This article investigates the pattern dependence of tunnelling magnetoresistance sensor noise behavior to determine the characteristics and the source of noise in the read sensor. It is shown that the TMR sensor noise is dependent on the cross-field direction of the dc pattern and is also influenced by the poor magnetic field gradient of the writer.
Keywords :
magnetic noise; magnetic sensors; magnetoresistive devices; tunnelling magnetoresistance; TMR sensor noise; dc pattern cross-field direction; magnetic field gradient; pattern dependence; read sensor; tunnelling magnetoresistance; Magnetic fields; Magnetic recording; Media; Noise; Noise measurement; Tunneling magnetoresistance; Writing;
Conference_Titel :
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7321-7
DOI :
10.1109/INTMAG.2015.7157468
