DocumentCode :
722189
Title :
Effect of topological bumpy surface underlayer on compositionally modulated atomic layer stacking for high Ku Co80Pt20 film with closed-packed orientation
Author :
Tham, K. ; Hinata, S. ; Saito, S.
Author_Institution :
TANAKA KIKINZOKU KOGYO, Sendai, Japan
fYear :
2015
fDate :
11-15 May 2015
Firstpage :
1
Lastpage :
1
Abstract :
Recently, closed-packed orientation CoPt-based alloys with oxides granular films have been studied as a candidate for the first generation microwave assisted magnetic recording (MAMR) media. For granular films, it is well known that the CoPt magnetic grains grown on a bumpy surface underlayer have a columnar structure and separated with oxides at the grain boundaries. To increase thermal stability of the grains, the enhancement of uniaxial magneto-crystalline anisotropy (Ku) of the grains is indispensable. In general, to further increase Ku of a CoPt-based alloy grains, increasing the spin-orbital interaction is thought to be effective. One way to achieve this is by forming a compositionally modulated atomic layer stacking structure. In this structure in-plane-disordered atomic layers of each composition are aligned parallelly to the substrate normal. Therefore, the authors consider the realization of such structure on a bumpy surface underlayer will be a big challenge. In this paper, we will discuss about the effect of the bumpy surface including surface roughness and grain size of the underlayer on compositionally modulated atomic layer stacking of overlying Co80Pt20 film in relation with Ku.
Keywords :
cobalt alloys; grain boundaries; grain size; granular materials; magnetic recording; magnetic thin films; metallic thin films; platinum alloys; spin-orbit interactions; surface roughness; Co80Pt20; CoPt-based alloys; closed-packed orientation; compositionally modulated atomic layer stacking; first generation microwave assisted magnetic recording; grain boundaries; grain size; oxides granular films; spin-orbital interaction; surface roughness; topological bumpy surface; Atomic layer deposition; Films; Grain size; Rough surfaces; Surface morphology; Surface roughness; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7321-7
Type :
conf
DOI :
10.1109/INTMAG.2015.7157523
Filename :
7157523
Link To Document :
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