Title :
Structure and giant inverse magnetocaloric effect of epitaxial Ni-Co-Mn-Al films
Author :
Teichert, N. ; Kucza, D. ; Yildirim, O. ; Hetaba, W. ; Behler, A. ; Yuzuak, E. ; Dincer, I. ; Helmich, L. ; Boehnke, A. ; Stoger-Pollach, M. ; Steiger-Thirsfeld, A. ; Waske, A. ; Schattschneider, P. ; Elerman, Y. ; Hutten, A.
Author_Institution :
Dept. of Phys., Bielefeld Univ., Bielefeld, Germany
Abstract :
In the presented work 200 nm thick epitaxial Ni41Co10.4Mn34.8Al13.8 thin films are studied. The films were deposited on heated MgO(001) substrates by co-sputtering. The structural properties of the films were investigated by atomic force microscopy, temperature dependent X-ray diffraction, and TEM. Magnetic and magnetocaloric properties were analyzed using temperature dependent and isothermal magnetization measurements. The structure of the martensite phase is shown to be an adaptive 14M phase. In order to analyze the metamagnetic characteristic of the martensitic transition of Ni-Co-Mn-Al films, temperature dependent field cooling (FC) and field heating (FH) magnetization curves were measured.
Keywords :
X-ray diffraction; aluminium alloys; atomic force microscopy; cobalt alloys; magnetic epitaxial layers; magnetisation; magnetocaloric effects; manganese alloys; martensitic transformations; metallic epitaxial layers; metamagnetism; nickel alloys; sputter deposition; transmission electron microscopy; vapour phase epitaxial growth; MgO; Ni41Co10.4Mn34.8Al13.8; TEM; atomic force microscopy; cosputtering; epitaxial thin films; field heating magnetization curves; giant inverse magnetocaloric effect; heated MgO(001) substrates; isothermal magnetization measurements; magnetic properties; martensite phase; martensitic transition; metamagnetic characteristics; size 200 nm; structural properties; temperature dependent X-ray diffraction; temperature dependent field cooling; Epitaxial growth; Magnetic field measurement; Magnetic films; Magnetization; Physics; Temperature measurement;
Conference_Titel :
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7321-7
DOI :
10.1109/INTMAG.2015.7157656
