DocumentCode :
722303
Title :
Coarse-grained molecular dynamics simulation of nanometer-thick polar lubricant films sheared between solid surfaces with random roughness
Author :
Kobayashi, T. ; Zhang, H. ; Fukuzawa, K. ; Itoh, S.
Author_Institution :
Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya, Japan
fYear :
2015
fDate :
11-15 May 2015
Firstpage :
1
Lastpage :
1
Abstract :
In hard disk drives (HDDs), the head-disk spacing needs to be reduced to less than 2 nm to achieve a target recording density of 4 Tbit/in2 [1]. At such a small spacing, liquid perfluoropolyether (PFPE) lubricant films coated on disk surfaces are more frequently subjected to shear confined between the head and the disk. Therefore, a detailed understanding of the shear phenomenon is essential for improving the lubrication performance and the reliability of the HDDs. To directly and efficiently probe the molecular-scale structure and dynamics of nanometer-thick polar PFPE films sheared between solid surfaces with random roughness, we developed a coarse-grained (CG) model and carried out CG molecular dynamics simulations coupled with a dissipative particle dynamics thermostat [2].
Keywords :
liquid films; lubricants; lubrication; molecular dynamics method; polymer films; polymer solutions; reliability; CG molecular dynamics simulation; coarse-grained model; coarse-grained molecular dynamics simulation; disk surfaces; dissipative particle dynamics; hard disk drives; head-disk spacing; liquid perfluoropolyether lubricant films; lubrication performance; molecular-scale structure; nanometer-thick polar PFPE films; nanometer-thick polar lubricant films; random roughness; shear confinement; shear phenomenon; solid surfaces; target recording density; thermostat; Films; Liquids; Rough surfaces; Solid modeling; Solids; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7321-7
Type :
conf
DOI :
10.1109/INTMAG.2015.7157666
Filename :
7157666
Link To Document :
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