DocumentCode :
722411
Title :
Eddy current loss analysis of non-contact magnetic device with permanent magnets based on analytical field calculations
Author :
Min, K. ; Choi, J. ; Cho, H. ; Kim, J.
Author_Institution :
Chungnam Nat. Univ., Dae-jeon, South Korea
fYear :
2015
fDate :
11-15 May 2015
Firstpage :
1
Lastpage :
1
Abstract :
This paper reports on the analysis of eddy current loss of an MC that uses a Halbach array PM on the basis of an analytical method. Halbach arrays and MC structure are shown. On the basis of the magnetic vector potential and two-dimensional(2-D) polar-coordinate system, the magnetic field solutions of the Halbach magnetized PM is obtained. In addition, using the derived magnetic field solution, analytical solutions for the eddy current density are obtained. Subsequently, the analytical solutions for eddy current loss derived using the equivalent electrical resistance calculated from the magnet volume and conductivity. A 2-D finite element analysis is employed to confirm the validity of the analytical results of the eddy current density and eddy current loss. Finally, this study investigates the influence of number of Halbach segments on the eddy current loss induced on the MC. More detailed analysis results and discussions will be presented in the final paper.
Keywords :
couplings; current density; eddy current losses; eddy currents; electric resistance; electrical conductivity; finite element analysis; magnetic devices; magnetisation; permanent magnets; 2D finite element analysis; 2D polar-coordinate system; Halbach magnetized permanent magnet; analytical field calculations; conductivity; eddy current density; eddy current loss analysis; equivalent electrical resistance; magnet volume; magnetic coupling structure; magnetic field solutions; magnetic vector potential; noncontact magnetic device; Eddy currents; Magnetic analysis; Magnetic devices; Magnetic fields; Magnetic flux; Temperature; Torque;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7321-7
Type :
conf
DOI :
10.1109/INTMAG.2015.7157796
Filename :
7157796
Link To Document :
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