• DocumentCode
    722467
  • Title

    Modeling of common mode currents on electric ship hull using scattering parameters

  • Author

    Rahmani, Maryam ; Mazzola, Michael

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Mississippi State Univ., Starkville, MS, USA
  • fYear
    2015
  • fDate
    21-24 June 2015
  • Firstpage
    156
  • Lastpage
    160
  • Abstract
    The behavioral modeling reported in this work is computationally efficient for use in modeling distributed currents and potentials throughout the open-form conductor that is the ship´s structure. Physics-based modeling is used to form a multiport S-parameter behavioral model of the ship´s structure that is compatible with S-parameter models of parasitic paths to grounded equipment enclosures and cables sheaths being developed by Florida State University, a university partner in the Electric Ship Research and Development Consortium. A time-domain common-mode conduction example is reported to illustrate the work flow that converts physics-based models of elementary hull elements into a complete S-parameter behavioral model of an arbitrary hull structure with power cables running along it.
  • Keywords
    cable sheathing; electric vehicles; electromagnetic interference; ships; Electric Ship Research and Development Consortium; Florida State University; behavioral modeling; cables sheaths; common mode currents; distributed current modeling; electric ship hull; elementary hull elements; grounded equipment enclosures; multiport S-parameter behavioral model; physics-based modeling; power cables; scattering parameters; ship structure; time-domain common-mode conduction; Computational modeling; Finite element analysis; Load modeling; Marine vehicles; Ports (Computers); Power cables; Scattering parameters; Electromagnetic Interference; Modeling; Open-form conductors; S-parameters; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electric Ship Technologies Symposium (ESTS), 2015 IEEE
  • Conference_Location
    Alexandria, VA
  • Print_ISBN
    978-1-4799-1856-0
  • Type

    conf

  • DOI
    10.1109/ESTS.2015.7157879
  • Filename
    7157879