DocumentCode :
722493
Title :
Modular scalable medium-voltage impedance measurement unit using 10 kV SiC MOSFET PEBBs
Author :
Cvetkovic, Igor ; Shen, Zhiyu ; Jaksic, Marko ; DiMarino, Christina ; Fang Chen ; Boroyevich, Dushan ; Burgos, Rolando
Author_Institution :
Center for Power Electron. Syst. (CPES), Virginia Tech, Blacksburg, VA, USA
fYear :
2015
fDate :
21-24 June 2015
Firstpage :
326
Lastpage :
331
Abstract :
This paper describes the design and implementation of the first functional medium-voltage impedance measurement unit capable of characterizing in-situ source and load impedances of dc- and ac-networks (4160 V ac, 6000 V dc, 300 A, 2.2 MVA) in the frequency range from 0.1 Hz-1 kHz. It comprises three power electronics building blocks, each built using SiC MOSFET H-bridges, features great reconfigurability, and allows both series and shunt perturbation injection in order to achieve accurate impedance characterization of the Navy´s shipboard power systems. With extraordinary advantages featured by the power electronics building block modular concept, and unconventional power processing benefits offered by SiC semiconductors, development of the unit shown in this paper unquestionably enables both, improvement of the existing, and design of the future, stable and reliable electrical Navy shipboard platforms with advanced electrical energy generation and modern distribution architecture.
Keywords :
MOSFET; bridge circuits; electric impedance measurement; marine power systems; power distribution reliability; ships; AC network; DC network; MOSFET H-bridges; MOSFET PEBB; Navy shipboard power system; SiC; advanced electrical energy; frequency 0.1 Hz to 1 kHz; in-situ source; load impedance; modern distribution architecture; modular scalable medium voltage impedance measurement unit; series perturbation injection; shunt perturbation injection; unconventional power processing; voltage 10 kV; Impedance; Impedance measurement; Power electronics; Power system stability; Silicon carbide; Stability criteria; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electric Ship Technologies Symposium (ESTS), 2015 IEEE
Conference_Location :
Alexandria, VA
Print_ISBN :
978-1-4799-1856-0
Type :
conf
DOI :
10.1109/ESTS.2015.7157913
Filename :
7157913
Link To Document :
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