Title :
Low-loss single-mode polymer optical waveguide at 1550-nm wavelength compatible with silicon photonics
Author :
Ishigure, Takaaki ; Yoshida, Sho ; Yasuhara, Kazuki ; Suganuma, Daisuke
Author_Institution :
Fac. of Sci. & Technol., Keio Univ., Yokohama, Japan
Abstract :
In this paper, we fabricate a very low-loss single-mode polymer optical waveguide at 1550-nm wavelength. For the single-mode waveguide fabrication, we apply a silicate based organic-inorganic hybrid resin, SUNCONNECT developed at Nissan Chemical Ind. Ltd. In the SUNCONNECT resin, the concentration of carbon-hydrogen bonding is lower than those in other conventional organic polymers, so the absorption loss at near infra-red region inherent to the carbon-hydrogen bonding is reduced: the propagation loss of the fabricated single-mode waveguide is as low as 0.5 dB/cm at 1550 nm, which is remarkably lower than the loss (approximately 1 dB/cm in general) of conventional organic polymer based waveguides at the same wavelength. The unique feature of this paper is in the fabrication method: the Mosquito method is applied. We succeeded in reducing the core diameter to less than 10 μm, and even a 3-μm core diameter is achieved. In the Mosquito method, the core is formed by horizontally scanning a needle with dispensing a core monomer into a cladding monomer. Here, the tip of the needle remains inserted into the cladding monomer while scanning.
Keywords :
elemental semiconductors; integrated optics; optical fabrication; optical losses; optical polymers; optical waveguides; silicon; Mosquito method; Nissan Chemical Ind. Ltd; SUNCONNECT; Si; absorption loss; carbon-hydrogen bonding; cladding monomer; low-loss single-mode polymer optical waveguide fabrication; near infrared region; needle; propagation loss; silicate based organic-inorganic hybrid resin; silicon photonics; single-mode waveguide fabrication; size 3 mum; wavelength 1550 nm; Needles; Optical device fabrication; Optical losses; Optical polymers; Optical waveguides; Propagation losses;
Conference_Titel :
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location :
San Diego, CA
DOI :
10.1109/ECTC.2015.7159679