DocumentCode
723122
Title
A Wafer Level approach for led packaging using TSV last technology
Author
Volpert, M. ; Soulier, B. ; Borel, S. ; Ait-Mani, N. ; Gaugiran, S. ; Gasse, A. ; Henry, D.
Author_Institution
MINATEC, CEA - LETI, Grenoble, France
fYear
2015
fDate
26-29 May 2015
Firstpage
1102
Lastpage
1108
Abstract
In the LED (Light-Emitting Diode) market the mounting, wire bonding connection and light color conversion are usually achieved on singulated chips. This increases the packaging cost, the reliability of the lighting system and slows its market expansion. In this paper, a Wafer Level Packaging (WLP) approach is described for a new type of LEDs. The innovative approach is based on the fabrication of LEDs using GaN nanowires growth onto silicon substrate, the integration of the LEDs color conversion and front side protection at the wafer level, and finally the fabrication of all the connecting pads and redistribution layer on the LEDs back side at the wafer level using Through Silicon Via (TSV) technology. We focus the discussion on the back-side process, starting with a description of the technological choices, followed by the detailed process of a TSV-last approach, and the different technological bricks developed. Finally the fabrication of a demonstrator is disclosed, with some preliminary electrical characterizations.
Keywords
III-V semiconductors; gallium compounds; integrated optoelectronics; light emitting diodes; nanowires; semiconductor growth; semiconductor quantum wires; three-dimensional integrated circuits; wafer level packaging; GaN nanowires; GaN-Si; LED packaging; Si; TSV last technology; Through Silicon Via technology; WLP; back-side process; color conversion; connecting pads; demonstrator fabrication; electrical characterizations; front side protection; light emitting diode; redistribution layer; wafer level packaging; Bonding; Copper; Light emitting diodes; Nanowires; Polymers; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location
San Diego, CA
Type
conf
DOI
10.1109/ECTC.2015.7159732
Filename
7159732
Link To Document