DocumentCode :
723134
Title :
Thermal cycling reliability of Sn-Zn lead-free solders in sensor application
Author :
Mostofizadeh, M. ; Das, D. ; Pecht, M. ; Frisk, L.
Author_Institution :
Dept. of Electr. Eng., Tampere Univ. of Technol., Tampere, Finland
fYear :
2015
fDate :
26-29 May 2015
Firstpage :
1240
Lastpage :
1246
Abstract :
There is a demand for low melting temperature solder in some applications (e.g., sensor attachment) where the components being soldered are temperature-sensitive. However, the same solder needs to meet the life cycle reliability requirements for the entire product. Among low temperature lead-free solders, eutectic Sn-9%Zn (wt.%) lead-free solder offers good mechanical reliability and low melting temperature. However, the presence of Zn makes it susceptible to oxidation especially at elevated temperatures. In this paper, the reliability of sensor attachments using Sn-9%Zn solder and capillary underfills was studied under thermal shock. Three different underfill materials were used with two of them containing fillers. The thermal shock test results showed that the underfills substantially improved the lifetime of the solder joints, and the underfills wth fillers provided the best mechanical support to the solder joints. The reliability of the Sn-9%Zn solder joints with underfills was found to be comparable to that of the Sn-Pb-2%Ag solder joints. Failure analysis revealed that a uniform distribution of the underfill was critical to achieve a reliable sensor attachment.
Keywords :
semiconductor device reliability; solders; thermal management (packaging); thermal shock; tin alloys; zinc alloys; Sn-Zn; eutectic lead-free solder; life cycle reliability; low melting temperature solder; low temperature lead-free solders; mechanical reliability; solder joints; thermal cycling reliability; thermal shock test results; Electric shock; Failure analysis; Lead; Reliability; Soldering; Temperature measurement; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location :
San Diego, CA
Type :
conf
DOI :
10.1109/ECTC.2015.7159755
Filename :
7159755
Link To Document :
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