Title :
Investigation of WLCSP corrosion induced reliability failure on halogens environment for wearable electronics
Author :
Chen, J.H. ; Kuo, Y.L. ; Tsao, P.H. ; Tseng, Jerry ; Chen, Megan ; Chen, T.M. ; Lin, Y.T. ; Antai Xu
Author_Institution :
Taiwan Semicond. Manuf. Co., Ltd., Hsinchu, Taiwan
Abstract :
Continuous miniaturization of microelectronic devices is enabling more portable and wearable electronic products such as thinner smart phones and smart watches. WLCSP (Wafer Level Chip Size Package) has been widely adopted for portable and wearable electronic products due to its compactness. Microelectronic devices in wearable products may be exposed to chlorine and fluorine because they come in direct contact with the human body under wearing condition. Products of chlorine corrosion have been found in WLCSP product evaluations, thus it is necessary to investigate WLCSP corrosion resistance and the factors affecting its corrosion reliability.
Keywords :
corrosion; halogens; integrated circuit reliability; wafer level packaging; WLCSP corrosion induced reliability failure; chlorine corrosion; corrosion reliability; corrosion resistance; halogens environment; wafer level chip size package; wearable electronics; Chemical lasers; Chemicals; Corrosion; Humidity; Metals; Power lasers; Reliability;
Conference_Titel :
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location :
San Diego, CA
DOI :
10.1109/ECTC.2015.7159810