DocumentCode :
723361
Title :
Impact of the emitter length scaling on electrical characteristics of horizontal current bipolar transistor with single polysilicon region
Author :
Koricic, M. ; Zilak, J. ; Suligoj, T.
Author_Institution :
Fac. of Electr. Eng. & Comput., Univ. of Zagreb, Zagreb, Croatia
fYear :
2015
fDate :
25-29 May 2015
Firstpage :
31
Lastpage :
36
Abstract :
Emitter length scaling of HCBT with single polysilicon region is investigated by 3D device simulations with the emphasis on the high frequency characteristics. It is shown that collector current and junction capacitances have linear dependence on the emitter length. Collector resistance can be represented by two components which appear in parallel, one that scales proportionally with the emitter length and a constant part which describes lateral portion of the extrinsic transistor. Cut-off frequency is improved for small emitter area devices due to current spreading in the collector region which reduces the current density and causes the base push-out at higher collector currents. The effect cannot be captured by scalable transistor model and separate set of model parameters is needed for transistors with very small emitter size.
Keywords :
bipolar transistors; current density; elemental semiconductors; semiconductor device models; silicon; 3D device simulations; Si; collector current; collector resistance; current density; electrical characteristics; emitter length scaling; high frequency characteristics; horizontal current bipolar transistor; junction capacitances; linear dependence; single polysilicon region; CMOS integrated circuits; Capacitance; Cutoff frequency; Mathematical model; Resistance; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information and Communication Technology, Electronics and Microelectronics (MIPRO), 2015 38th International Convention on
Conference_Location :
Opatija
Type :
conf
DOI :
10.1109/MIPRO.2015.7160233
Filename :
7160233
Link To Document :
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