DocumentCode
723511
Title
Foreword
Author
Nouet, Pascal
fYear
2015
fDate
27-30 April 2015
Firstpage
1
Lastpage
1
Abstract
DTIP´2015 will be the 17th edition of the Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS. This unique single-meeting event brings together participants interested in MEMS/MOEMS processing and those interested in design tools and methods to facilitate the design of MEMS/MOEMS. In these three days, all aspects including design, modeling, testing, micro-machining, integration and packaging of structures, devices and systems will be addressed in: • Nine regular sessions, • One special Session on “Co-design for MEMS based Smart Systems”, • Four poster introduction sessions, • Two poster presentation sessions, • Three invited talks.
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2015 Symposium on
Conference_Location
Montpellier, France
Print_ISBN
978-1-4799-8627-9
Type
conf
DOI
10.1109/DTIP.2015.7160958
Filename
7160958
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