DocumentCode :
723531
Title :
A proposed RTL design technique for highly optimized on-chip data processors of MEMS sensors
Author :
Horvath, Peter ; Hosszu, Gabor ; Kovacs, Ferenc
Author_Institution :
Dept. of Electron Devices, Budapest Univ. of Technol. & Econ., Budapest, Hungary
fYear :
2015
fDate :
27-30 April 2015
Firstpage :
1
Lastpage :
4
Abstract :
Semiconductor sensor systems based on specific MEMS structures usually have to comprise at least a robust on-chip analogue read-out circuitry making it possible to detect and post-process the changes in physical characteristics. In order to ensure mobility or to improve reliability, robustness and performance (speed and/or power-consumption) the subsequent parts of the post-processing circuitry, namely the digital data processor or certain parts of it may also be implemented on-chip. Integration and cost usually treated as main objectives in both analogue and digital designs become essential when the data-processing subsystem has to be fit in a very limited area close to a MEMS sensor structure. The paper presents a novel Register-Transfer Level (RTL) design method aiming optimized design of digital data-processing systems related to MEMS sensors´ post-processing algorithms. The paper presents a novel RTL description language and a unique synthesis flow resulting in area-optimized gate-level implementations capable of fulfilling the strict requirements set by the MEMS-based sensor environment.
Keywords :
analogue integrated circuits; microprocessor chips; microsensors; MEMS sensor structure; MEMS structures; RTL description language; analogue design; area-optimized gate-level implementations; digital design; optimized on-chip data processors; post-processing circuitry; register transfer level; robust on-chip analogue read-out circuitry; semiconductor sensor; Algorithm design and analysis; Design methodology; Integrated circuit modeling; Micromechanical devices; Sensor systems; System-on-chip; AMDL; Algorithmic Microarchitecture Description Language; RTL design; design automation; digital data processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2015 Symposium on
Conference_Location :
Montpellier
Print_ISBN :
978-1-4799-8627-9
Type :
conf
DOI :
10.1109/DTIP.2015.7160989
Filename :
7160989
Link To Document :
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