DocumentCode
723566
Title
Dielectric charging frequency response of MEMS switches with insulator-insulator contact
Author
Molinero, David ; Cunningham, Shawn ; DeReus, Dana ; Morris, Arthur
Author_Institution
Wispry, Inc., Irvine, CA, USA
fYear
2015
fDate
27-30 April 2015
Firstpage
1
Lastpage
4
Abstract
An extensive dielectric charging characterization is presented based on MEMS test structures with insulator-insulator contact. Surface charging by triboelectric effects has been the main mechanism that degrades the switch performance when both insulators are in contact. Surface charging not only changes by the applied electric field needed to close the switch, but also by the driving frequency. In this paper, we analyze and report the surface charging effects based on the applied electric field and cycling frequency. The results have shown a logarithmic time dependence of the surface charge generated at DC levels with a low pass filter characteristic at higher frequencies. Measurements show a cutoff frequency of approximately 100 Hz, so driving frequencies beyond 100 Hz will show a reduction of the amount of charge generated.
Keywords
electrical contacts; low-pass filters; microswitches; surface charging; MEMS switches; MEMS test structures; cycling frequency; dielectric charging frequency response; electric field; insulator-insulator contact; logarithmic time dependence; low pass filter; surface charging; triboelectric effects; Capacitors; Frequency measurement; Micromechanical devices; Surface charging; Switches; Voltage measurement; Charging; Dielectrics; Micromechanical Devices; RF MEMS; Switches; triboelectric effects;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2015 Symposium on
Conference_Location
Montpellier
Print_ISBN
978-1-4799-8627-9
Type
conf
DOI
10.1109/DTIP.2015.7161041
Filename
7161041
Link To Document