DocumentCode :
724568
Title :
Power control for S-parameters and large signal characterization at (sub)-mmWave frequencies
Author :
Galatro, L. ; Galbano, S. ; Santaniello, A. ; Spirito, M.
Author_Institution :
Electron. Res. Lab., Delft Univ. of Technol., Delft, Netherlands
fYear :
2015
fDate :
22-22 May 2015
Firstpage :
1
Lastpage :
4
Abstract :
In this contribution we present a frequency scalable approach to achieve an accurate power control for levelled s-parameters and large signal characterization of devices working at millimeter and sub-millimeter waves. The method is based on a software-aided control loop that mimics the behavior of an automatic level control system, allowing to dynamically adjust the power delivered to the DUT at every frequency. The proposed hardware configuration employs only the VNA mm-wave extender modules, bypassing the need of expensive add-on test-sets. Measurement results are provided in WR-10, WR-05 and WR-03 waveguide bands to show the applicability of the method at different frequencies and different hardware setups (i.e., VNA extender modules from different vendors). The power control at the system ports and the capabilities of the proposed setup for power controlled S-parameters and large signal measurements are reported.
Keywords :
S-parameters; level control; millimetre wave devices; millimetre wave measurement; network analysers; power control; submillimetre wave devices; submillimetre wave measurement; waveguides; DUT; S-parameter measurement; VNA mmwave extender module; WR-03 waveguide band; WR-05 waveguide band; WR-10 waveguide band; add-on test-set; automatic level control system; frequency scalable approach; hardware configuration; large signal characterization; large signal measurement; levelled S-parameter; millimeter wave device; power control; software-aided control loop; submillimeter wave device; system port; Calibration; Frequency control; Frequency measurement; Power control; Power measurement; Standards; Thermal stability; S-parameters; large signal characterization; mm-wave characterization; vector network analyzer (VNA);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2015 85th
Conference_Location :
Phoenix, AZ
Type :
conf
DOI :
10.1109/ARFTG.2015.7162903
Filename :
7162903
Link To Document :
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