• DocumentCode
    724576
  • Title

    Physical models for 2.4 mm and 3.5 mm coaxial VNA calibration kits developed within the NIST microwave uncertainty framework

  • Author

    Jargon, Jeffrey A. ; Chihyun Cho ; Williams, Dylan F. ; Hale, Paul D.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • fYear
    2015
  • fDate
    22-22 May 2015
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    We developed physical models of commercially-available 2.4 mm and 3.5 mm coaxial calibration kits for vector network analyzers. These models support multiline thru-reflect-line (TRL) and open-short-load-thru (OSLT) calibrations, and include error mechanisms in each of the standards´ constituent parameters that can be utilized in the NIST Microwave Uncertainty Framework to propagate uncertainties. For both connector sizes, we calibrated a network analyzer using the two calibration methods, and compared measurements and uncertainties made on a number of verification devices. In both cases, we showed that the two calibrations agree to within their respective uncertainties.
  • Keywords
    calibration; measurement standards; measurement uncertainty; network analysers; NIST microwave uncertainty framework; OSLT calibration; TRL calibration; coaxial VNA calibration kit; multiline thru-reflect-line calibration; open-short-load-thru calibration; physical model; vector network analyzer; Calibration; Frequency measurement; Load modeling; Polynomials; Reflection coefficient; Standards; Uncertainty; calibration; coaxial; physical models; uncertainty; vector network analyzer; verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference (ARFTG), 2015 85th
  • Conference_Location
    Phoenix, AZ
  • Type

    conf

  • DOI
    10.1109/ARFTG.2015.7162913
  • Filename
    7162913