DocumentCode :
72485
Title :
Estimating Damping in Microresonators by Measuring Thermomechanical Noise Using Laser Doppler Vibrometry
Author :
Kuter-Arnebeck, Ottoleo ; Labuda, Aleksander ; Joshi, S. ; Das, Krishanu ; Vengallatore, Srikar
Author_Institution :
Dept. of Mech. Eng., McGill Univ., Montreal, QC, Canada
Volume :
23
Issue :
3
fYear :
2014
fDate :
Jun-14
Firstpage :
592
Lastpage :
599
Abstract :
The fluctuation-dissipation theorem establishes the fundamental links between thermomechanical noise and damping. In this paper, we bridge the gap between theory and practice by developing protocols for estimating dissipation in low-loss microresonators by measuring thermomechanical noise using laser Doppler vibrometry. The measurement does not require external actuation of the device and damping can be estimated without relying upon knowledge of material properties, device dimensions, or structural stiffness. The power spectral density of velocity and displacement noise is computed using a direct method that avoids segmenting the measurements in the time domain, thereby avoiding any bias in the estimation of the quality factor. We demonstrate the implementation of the protocol by measuring damping at room temperature and low pressure in four silicon-based microcantilever resonators with natural frequencies ranging from 17.6 to 26.7 kHz and quality factors ranging from 2×104 to 2×105 . The accuracy of noise-based estimates is evaluated by comparison with values of the log decrement measured under free decay.
Keywords :
Doppler measurement; Q-factor; cantilevers; damping; laser velocimetry; micromechanical resonators; noise measurement; damping estimation; device dimensions; displacement noise; dissipation estimation; fluctuation-dissipation theorem; frequency 17.6 kHz to 26.7 kHz; laser Doppler vibrometry; low-loss microresonators; material properties; noise-based estimates; power spectral density; protocols; quality factor estimation; silicon-based microcantilever resonators; structural stiffness; temperature 293 K to 298 K; thermomechanical noise measurement; time domain; velocity density; Damping; Frequency measurement; Noise; Noise measurement; Resonant frequency; Thermomechanical processes; Vibrations; MEMS; damping; laser Doppler vibrometry; laser Doppler vibrometry.; microresonators; thermomechanical noise;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2013.2286199
Filename :
6650014
Link To Document :
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