Title :
Improved functional cortical parcellation using a neighborhood-information-embedded affinity matrix
Author :
Chendi Wang ; Yoldemir, Burak ; Abugharbieh, Rafeef
Author_Institution :
Biomed. Signal & Image Comput. Lab., Univ. of British Columbia, Vancouver, BC, Canada
Abstract :
Cortical parcellation of the human brain typically serves as a basis for higher-level analyses such as connectivity analysis and investigation of brain network properties. Inferences drawn from such analyses can be significantly confounded if the brain parcels are inaccurate. In this paper, we propose a novel affinity matrix structure based on multiple kernel density estimation for cortical parcellation. Neighborhood functional connectivity is embedded into the affinity matrix, which serves the dual purpose of allowing self-adaptive adjustment of voxel affinity values and providing robustness against noise. The proposed affinity matrix can be used with any parcellation method that takes an affinity matrix as its input. In our validation tests, we apply normalized cuts on our proposed affinity matrix to evaluate performance. On synthetic and real data, we demonstrate that the use of our proposed affinity matrix in lieu of the classical definition better delineates spatially contiguous parcels with higher test-retest reliability and improved inter-subject consistency.
Keywords :
biomedical MRI; brain; image classification; image denoising; medical image processing; neurophysiology; brain network properties; brain parcels; classical definition; connectivity analysis; higher-level analyses; human brain; improved functional cortical parcellation; intersubject consistency; multiple kernel density estimation; neighborhood-information-embedded affinity matrix; normalized cuts; self-adaptive adjustment; test-retest reliability; Clustering methods; Correlation; Estimation; Kernel; Measurement; Noise; Reliability; Affinity matrix; clustering; functional cortical parcellation; neighborhood connectivity;
Conference_Titel :
Biomedical Imaging (ISBI), 2015 IEEE 12th International Symposium on
Conference_Location :
New York, NY
DOI :
10.1109/ISBI.2015.7164123