• DocumentCode
    725116
  • Title

    Use of simulation studies to overcome key challenges in the fab automation of a 300 mm power semiconductor pilot line comprising thin-wafer processing

  • Author

    Schneider, Germar ; Wagner, Thomas ; Kraft, Martin

  • Author_Institution
    Infineon Dresden Technol. GmbH, Dresden, Germany
  • fYear
    2015
  • fDate
    3-6 May 2015
  • Firstpage
    42
  • Lastpage
    47
  • Abstract
    Infineon Technologies Dresden establishes the worldwide first highly automated high volume production for power semiconductors based on 300 mm thin wafer technologies. For this special manufacturing platform, there are a lot of challenges for manufacturing and automation. During the research phases in preparation for the future 300 mm pilot lines different simulation studies for wafers, substrates and the existing transportation system are powerful methods to get out the best manufacturing and automation concepts for the future fabs. This article gives an overview of key challenges and shows ways how to overcome the obstacles using innovative manufacturing and automation applications optimized through smart simulation.
  • Keywords
    factory automation; integrated circuit manufacture; power integrated circuits; production engineering computing; production planning; fab automation key challenges; high volume production; highly automated production; pilot lines; power semiconductor pilot line; simulation studies; size 300 mm; smart simulation; thin wafer processing; Automation; Finite element analysis; Optimization; Production; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference (ASMC), 2015 26th Annual SEMI
  • Conference_Location
    Saratoga Springs, NY
  • Type

    conf

  • DOI
    10.1109/ASMC.2015.7164448
  • Filename
    7164448