Title :
Power consumption analysis of computing facilities with superconducting Josephson junction quantum computers
Author :
Abegaz, Brook W. ; Mahajan, Satish M. ; Johnson, R. Wayne
Author_Institution :
Dept. of Electr. & Comput. Eng., Tennessee Technol. Univ., Cookeville, TN, USA
Abstract :
In this paper, the power consumption of present-day computing facilities which are based on Complementary Metal-Oxide Semiconductor Field Effect Transistor (CMOS) devices is compared with that of Josephson junction superconductor based computing facilities of the future. First, the amount of power used by present-day computing facilities was identified in different regions of the world. Then, the energy consumption of computing facilities of the future is presented considering superconducting Josephson junction devices as the primary building blocks of constituent quantum computers. From the results, it was identified that implementing superconducting devices in computing facilities could decrease the energy consumption by up to two orders of magnitude as compared to CMOS based semiconductor devices. The low power consumption and the fast operational speed of the Josephson junction superconductor based quantum computers were also identified to be superior than the semiconductor based computing facilities.
Keywords :
power consumption; quantum computing; superconducting junction devices; CMOS devices; Josephson junction superconductor based computing facilities; Josephson junction superconductor based quantum computers; complementary metal-oxide semiconductor field effect transistor; constituent quantum computers; energy consumption; power consumption; superconducting Josephson junction devices; Computers; Josephson junctions; Junctions; Power demand; Quantum computing; Switches; computing; improvement; power consumption; semiconductors; superconductors; trade-off;
Conference_Titel :
Environment and Electrical Engineering (EEEIC), 2015 IEEE 15th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4799-7992-9
DOI :
10.1109/EEEIC.2015.7165366