Investigation of Flip-Flop Effects in a Linear Analog Comparator-With-Hysteresis Circuit

Author

Roche, Nicholas J.-H ; Buchner, Stephen P. ; Roig, Fabien ; Dusseau, L. ; Warner, Jeffrey H. ; Boch, J. ; McMorrow, Dale ; Saigne, F. ; Auriel, G. ; Azais, Bruno

Author_Institution

U.S. Naval Res. Lab., Washington, DC, USA

Volume

60

Issue

4

fYear

2013

fDate

Aug. 2013

Firstpage

2542

Lastpage

2549

Abstract

The impact of the positive feedback loop on analog single event transient (ASET) shapes was investigated for a comparator-with-hysteresis circuit. Simulation based on previous developed ASET simulation tool is used to model the impact of the power supply voltage, the input voltage level and the injected energy. Simulation results show that these kinds of circuits are sensitive to flip-flop effects. This phenomenon occurs if the input voltage is in the hysteresis band range. In this case, simulations show that the ASET can latch the output into a non-desired state by changing the state of the circuit on his transfer characteristic curves. Laser experiments were conducted and show that the simulation outputs are in agreement with the experimental collected data.

Keywords

circuit feedback; circuit simulation; comparators (circuits); flip-flops; hysteresis; integrated circuit modelling; ASET simulation tool; analog single event transient shapes; flip-flop effects; hysteresis band range; hysteresis circuit; injected energy; input voltage level; linear analog comparator; positive feedback loop; power supply voltage; transfer characteristic curves; Hysteresis; Integrated circuit modeling; Power supplies; Shape; Threshold voltage; Transistors; Voltage measurement; Bipolar circuits; integrated circuit modeling; single event transient; transient propagation; transient response;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2013.2258682

Filename

6518185