Title :
Evolution of transverse correlation in stochastic electromagnetic fields
Author :
Russer, Johannes A. ; Gradoni, Gabriele ; Tanner, Gregor ; Creagh, Stephen C. ; Thomas, David ; Smartt, Christopher ; Russer, Peter
Author_Institution :
Inst. for Nanoelectron., Tech. Univ. Munchen, Munich, Germany
Abstract :
In this work the evolution of the transverse correlation with increasing distance is investigated analytically and numerically. To characterize a stochastic EM field by measurements we have to sense the electromagnetic field in pairs of sampling points and to compute the correlations of all pairs. In the far-field, the field cross correlation functions depend only on the coordinate differences. This yields a considerable reduction of the measurement effort.
Keywords :
correlation methods; electric variables measurement; electromagnetic interference; all-pair correlation; electromagnetic interference; field cross correlation functions; measurement effort reduction; near-field scanning; sampling points; stochastic EM field; stochastic electromagnetic fields; transverse correlation evolution; Stochastic electromagnetic fields; electromagnetic interference; near-field scanning; noisy electromagnetic fiefs;
Conference_Titel :
Microwave Symposium (IMS), 2015 IEEE MTT-S International
Conference_Location :
Phoenix, AZ
DOI :
10.1109/MWSYM.2015.7166953