• DocumentCode
    726351
  • Title

    Self-correcting STTRAM under magnetic field attacks

  • Author

    Jae-Won Jang ; Jongsun Park ; Ghosh, Swaroop ; Bhunia, Swarup

  • Author_Institution
    Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
  • fYear
    2015
  • fDate
    8-12 June 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Spin-Transfer Torque Random Access Memory (STTRAM) is a possible candidate for universal memory due to its high-speed, low-power, non-volatility, and low cost. Although attractive, STTRAM is susceptible to contactless tampering through malicious exposure to magnetic field with the intention to steal or modify the bitcell content. In this paper, for the first time to our knowledge, we analyze the impact of magnetic attacks on STTRAM using micro-magnetic simulations. Next, we propose a novel array-based sensor to detect the polarity and magnitude of such attacks and then propose two design techniques to mitigate the attack, namely, array sleep with encoding and variable strength Error Correction Code (ECC). Simulation results indicate that the proposed sensor can reliably detect an attack and provide sufficient compensation window (few ns to ~100us) to enable proactive protection measures. Finally, we shows that variable-strength ECC can adapt correction capability to tolerate failures with various strength of an attack.
  • Keywords
    error correction codes; magnetic fields; random-access storage; sensors; ECC; array-based sensor; compensation window; correction capability; design techniques; encoding; magnetic field attacks; micromagnetic simulations; proactive protection measures; self-correcting STTRAM; spin-transfer torque random access memory; universal memory; variable strength error correction code; Arrays; Decoding; Error correction; Error correction codes; Generators; Magnetic fields; Magnetic tunneling; Contactless tampering; Magnetic field attack; On-chip tamper mitigation; Replica; STTRAM; Variable ECC;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1145/2744769.2744909
  • Filename
    7167261