• DocumentCode
    726363
  • Title

    Understanding soft errors in uncore components

  • Author

    Hyungmin Cho ; Chen-Yong Cher ; Shepherd, Thomas ; Mitra, Subhasish

  • Author_Institution
    Dept. of EE, Stanford Univ., Stanford, CA, USA
  • fYear
    2015
  • fDate
    8-12 June 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The effects of soft errors in processor cores have been widely studied. However, little has been published about soft errors in uncore components, such as memory subsystem and I/O controllers, of a System-on-a-Chip (SoC). In this work, we study how soft errors in uncore components affect system-level behaviors. We have created a new mixed-mode simulation platform that combines simulators at two different levels of abstraction, and achieves 20,000× speedup over RTL-only simulation. Using this platform, we present the first study of the system-level impact of soft errors inside various uncore components of a large-scale, multi-core SoC using the industrial-grade, open-source OpenSPARC T2 SoC design. Our results show that soft errors in uncore components can significantly impact system-level reliability. We also demonstrate that uncore soft errors can create major challenges for traditional system-level checkpoint recovery techniques. To overcome such recovery challenges, we present a new replay recovery technique for uncore components belonging to the memory subsystem. For the L2 cache controller and the DRAM controller components of OpenSPARC T2, our new technique reduces the probability that an application run fails to produce correct results due to soft errors by more than 100× with 3.32% and 6.09% chip-level area and power impact, respectively.
  • Keywords
    DRAM chips; cache storage; multiprocessing systems; power aware computing; public domain software; system-on-chip; DRAM controller components; IO controllers; L2 cache controller; RTL-only simulation; chip-level area; memory subsystem; mixed-mode simulation platform; multicore SoC; open-source OpenSPARC T2 SoC design; power impact; processor cores; soft errors; system-level behaviors; system-level impact; system-level reliability; system-on-a-chip; uncore components; Acceleration; Arrays; Benchmark testing; Flip-flops; Random access memory; Resilience; System-on-chip; Recovery; Simulation; Soft Error; Uncore Components;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1145/2744769.2744923
  • Filename
    7167273