Title :
A SPICE model of flexible transition metal dichalcogenide field-effect transistors
Author :
Ying-Yu Chen ; Zelei Sun ; Deming Chen
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
This paper presents the first SPICE model of the transition metal dichalcogenide (TMD) field-effect transistor (FET), which is a promising candidate for flexible electronics. The model supports different transistor design parameters such as width, length, oxide thickness, and various channel materials (MoS2, WSe2, etc.), as well as the applied strain, which enables the evaluation of transistor- and circuit-level behavior under process variation and different levels of bending. We performed SPICE simulations on digital logic gates to explore the design space of both MoS2- and WSe2-based transistors, and to evaluate the projected performance of these circuits under applied strain. Our simulations show that WSe2 circuits outperform MoS2 and Si-based CMOS in terms of energy-delay product (EDP) by up to 1 order of magnitude, depending on applications. Finally, we investigate TMDFET´s behavior under process variation.
Keywords :
CMOS integrated circuits; field effect transistors; molybdenum compounds; semiconductor device models; silicon; tungsten compounds; CMOS process; MoS2; SPICE model; Si; TMD field-effect transistors; WSe2; circuit-level behavior; digital logic gates; energy-delay product; flexible electronics; flexible transition metal dichalcogenide; transistor-level behavior; Computational modeling; Delays; Field effect transistors; Integrated circuit modeling; Mathematical model; Photonic band gap; MoS2; SPICE; TMDFET; WSe2; compact modeling; exible electronics; process variation; simulation;
Conference_Titel :
Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
DOI :
10.1145/2744769.2744782