Title :
Designing silicon carbide NMOS integrated circuits for wide temperature operation
Author :
Cheng-Po Chen ; Ghandi, Reza
Author_Institution :
Global Res. Center, Gen. Electr., Niskayuna, NY, USA
Abstract :
Designing integrated circuits using silicon carbide (SiC) MOSFETs for operation in a wide temperature range brings unique challenges that require a good understanding of device characteristics, careful analysis of device-circuit interactions and a fresh look at what the technology can and cannot do. We describe the available devices in General Electric´s SiC MOSFET-based technology, and use common-source amplifiers as examples in the context of designing a circuit for a wide temperature range from 25 C to 500 C.
Keywords :
MOS integrated circuits; MOSFET; amplifiers; silicon compounds; wide band gap semiconductors; GE; MOSFET; NMOS integrated circuit; SiC; common-source amplifier; device-circuit interaction; general electric; silicon carbide; temperature 25 C to 500 C; wide temperature operation; Gain; Logic gates; MOSFET; Resistors; Silicon carbide; Temperature distribution; Temperature sensors; MOSFET; high temperature electronics; silicon carbide;
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
DOI :
10.1109/ISCAS.2015.7168582