• DocumentCode
    726949
  • Title

    Designing silicon carbide NMOS integrated circuits for wide temperature operation

  • Author

    Cheng-Po Chen ; Ghandi, Reza

  • Author_Institution
    Global Res. Center, Gen. Electr., Niskayuna, NY, USA
  • fYear
    2015
  • fDate
    24-27 May 2015
  • Firstpage
    109
  • Lastpage
    112
  • Abstract
    Designing integrated circuits using silicon carbide (SiC) MOSFETs for operation in a wide temperature range brings unique challenges that require a good understanding of device characteristics, careful analysis of device-circuit interactions and a fresh look at what the technology can and cannot do. We describe the available devices in General Electric´s SiC MOSFET-based technology, and use common-source amplifiers as examples in the context of designing a circuit for a wide temperature range from 25 C to 500 C.
  • Keywords
    MOS integrated circuits; MOSFET; amplifiers; silicon compounds; wide band gap semiconductors; GE; MOSFET; NMOS integrated circuit; SiC; common-source amplifier; device-circuit interaction; general electric; silicon carbide; temperature 25 C to 500 C; wide temperature operation; Gain; Logic gates; MOSFET; Resistors; Silicon carbide; Temperature distribution; Temperature sensors; MOSFET; high temperature electronics; silicon carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
  • Conference_Location
    Lisbon
  • Type

    conf

  • DOI
    10.1109/ISCAS.2015.7168582
  • Filename
    7168582