Title :
A novel 20-bit R-2R DAC structure based on ordered element matching
Author :
You Li ; Degang Chen
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ. Ames, Ames, IA, USA
Abstract :
Random mismatch errors in the resistor networks are one of the dominant nonlinearity sources for high resolution and high accuracy resistor DACs. It is rigorously proven and verified that ordered element matching (OEM) technology could significantly reduce the random mismatch errors. This paper proposed a novel 20-bit three-segment R-2R DAC structure based on OEM theory. It can achieve high matching accuracy by choosing and regrouping the resistors in two unary weighted resistor arrays according to their resistance measurement results. A behavioral model of proposed 20-bit R-2R DAC structure is created in MATLAB. The statistical results show a significant resistor area reduction compared with the only one existing 20bit R-2R DAC in literature.
Keywords :
digital-analogue conversion; electric reactance measurement; resistors; MATLAB; OEM; digital-to-analog converter; nonlinearity sources; ordered element matching; random mismatch errors; resistance measurement; resistor networks; three-segment R-2R DAC structure; unary weighted resistor arrays; word length 20 bit; Accuracy; Electrical resistance measurement; Linearity; Mathematical model; Resistance; Resistors; Switches;
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
DOI :
10.1109/ISCAS.2015.7168812
