Title :
A one-shot digital correlated double sampling with a differential difference amplifier for a high speed CMOS image sensor
Author :
Suho Son ; Shiwon Jeon ; Seol Namgung ; Jieun Yoo ; Minkyu Song
Author_Institution :
Dept. of Semicond. Sci., Dongguk Univ., Seoul, South Korea
Abstract :
In order to raise the operating speed of a CMOS image sensor (CIS), a new technique of digital correlated double sampling (CDS) is described. In general, a fixed pattern noise (FPN) of a CIS has been reduced with the subtraction algorithm between the reset signal and pixel signal. This is because a single-slope analog-to-digital converter (ADC) has been normally adopted in the conventional digital CDS with the reset ramp and signal ramp. Thus, the operating speed of a digital CDS is much slower than that of an analog CDS. In order to improve the operating speed, we propose a one-shot digital CDS based on a differential difference amplifier (DDA) that compares the reset signal and the pixel signal using only one ramp. The prototype CIS has been fabricated with 0.13μm CIS technology and it has the VGA resolution of 640×480. The measured conversion time is 16 μs, and a high frame rate of 131fps is achieved at the VGA resolution.
Keywords :
CMOS image sensors; analogue-digital conversion; differential amplifiers; sampling methods; ADC; CIS; CMOS image sensor; DDA; FPN; VGA resolution; differential difference amplifier; digital correlated double sampling; fixed pattern noise; one-shot digital CDS; pixel signal; reset ramp; reset signal; signal ramp; single-slope analog-to-digital converter; size 0.13 mum; subtraction algorithm; time 16 mus; CMOS image sensors; Capacitors; Image resolution; Radiation detectors; Signal resolution; Solid state circuits; Timing; CMOS Image Sensor; differential difference amplifier; fixed pattern noise; one-shot digital correlated double sampling;
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
DOI :
10.1109/ISCAS.2015.7168818