Title :
180.5Mbps-8Gbps DLL-based clock and data recovery circuit with low jitter performance
Author :
Yuequan Liu ; Yuan Wang ; Song Jia ; Xing Zhang
Author_Institution :
Key Lab. of Microelectron. Devices & Circuits (MoE), Peking Univ., Beijing, China
Abstract :
A wide range delay-locked loop (DLL) based clock and data recovery (CDR) circuit including coarse and fine tune blocks is proposed in this paper. The coarse tune block adopts a time to digital converter and digital control delay line to widen the frequency capture range, reduce locking time and prevent the false locking problem. In the fine tune block, a novel phase detector combines the tasks of sampling and charge-pump using half rate clock. Starting-control circuit can ensure CDR takes full use of the delay range provided by voltage control delay line. Moreover, a fully analog DLL technique is applied to exploit the benefits of low skew and jitter performance. The simulation result shows the proposed CDR can cover a wide frequency range from 180.5Mbps to 8Gbps, while the peak-to-peak jitter of recovery clock is 2.7ps at 200Mbps and 1.06ps at 8Gbps. Fabricated in a 65nm CMOS process, this design dissipates 9.9mW and 22.9mW respectively at 200 Mbps and 8Gbps from a 1.2 V supply.
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; charge pump circuits; circuit tuning; clock and data recovery circuits; delay lines; delay lock loops; digital control; jitter; phase detectors; voltage control; CDR circuit; CMOS process; DLL; bit rate 180.5 Mbit/s to 8 Gbit/s; charge-pump circuit; clock and data recovery circuit; coarse tune block; complementary metal oxide semiconductor; delay-locked loop; digital control delay line; digital converter; false locking; fine tune block; frequency capture range; half rate clock; jitter performance; locking time reduction; peak-to-peak jitter; phase detector; power 22.9 mW; power 9.9 mW; sampling circuit; size 65 nm; starting-control circuit; voltage 1.2 V; voltage control delay line; Clocks; Delay lines; Delays; Jitter; Partial discharges; Tuning; Voltage control; Clock and data recovery (CDR); delay-locked loop (DLL); low jitter; time-to-digital converter (TDC); wide-range;
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
DOI :
10.1109/ISCAS.2015.7168903