Title :
A 3.46 Gb/s (9141,8224) LDPC-based ECC scheme and on-line channel estimation for solid-state drive applications
Author :
Kin-Chu Ho ; Chih-Lung Chen ; Yen-Chin Liao ; Hsie-Chia Chang ; Chen-Yi Lee
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
As the reliability of NAND Flash memory keeps degrading, Low-Density Parity-Check (LDPC) codes are widely proposed to extend the endurance of Solid State Drive (SSD). However, implementing powerful decoding algorithm such as soft min-sum algorithm with high decoding speed comes along with higher hardware cost. To achieve efficient hardware cost, we propose a multi-strategy ECC scheme which consists of modified gradient descent bit-flipping (MGDBF), hard min-sum, and soft min-sum decoders. The MGDBF decoder aims to correct most of the erroneous codewords with advantages of high decoding throughput and low hardware cost, while the soft min-sum decoder is targeted to correct codewords with large number of errors under moderate decoding throughput and reasonable hardware cost. In addition, we propose a bi-sectional channel estimation technique which enables on-line estimation of distribution to generate accurate soft information for LDPC decoding with low complexity. The ECC codec and the complete Toggle DDR 1.0 NAND interface control circuits are integrated and fabricated in 90nm CMOS process. The throughput of proposed MGDBF decoder achieves 3.46 Gb/s which satisfies the throughput requirement of both toggle DDR 1.0 and 2.0 NAND interfaces.
Keywords :
CMOS memory circuits; NAND circuits; channel estimation; decoding; error correction codes; flash memories; gradient methods; parity check codes; CMOS process; ECC codec; LDPC codes; MGDBF; NAND Flash memory reliability; SSD; Toggle DDR 1.0 NAND interface control circuits; bi-sectional channel estimation technique; bit rate 3.46 Gbit/s; decoding throughput; erroneous codewords; hard min-sum decoders; hardware cost; low-density parity-check codes; modified gradient descent bit-flipping; multi-strategy ECC scheme; online estimation; size 90 nm; soft information; soft min-sum algorithm; soft min-sum decoders; solid state drive; toggle DDR 2.0 NAND interfaces; Ash; Bit error rate; Decoding; Error correction codes; Hardware; Parity check codes; Throughput; LDPC codes; NAND Flash memory; Solid State Drive;
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
DOI :
10.1109/ISCAS.2015.7168917