Title :
A 9-bit body-biased vernier ring time-to-digital converter in 65 nm CMOS technology
Author :
Junjie Kong ; Liter Siek ; Chiang-Liang Kok
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
A high resolution Vernier Ring Time-to-digital Converter is presented in this paper. Body bias is applied to its delay cells to obtain a finer delay difference between two delay chains. The delay cells and arbiters are implemented in a ring structure, thus allowing a large input time interval to be measured. The digital circuit nature of this converter is also attractive for low power and small area design. The simulation results reveal a 3 ps resolution, a -0.22/0.11 LSB differential nonlinearity (DNL) and a 9-bit range. The prototype chip is fabricated in 65 nm CMOS process consuming 0.44 mW with a 1.2 V power supply and occupies an area of 0.014 mm2.
Keywords :
CMOS digital integrated circuits; delay circuits; time-digital conversion; CMOS technology; DNL; body-biased vernier ring; delay cell; delay chain; differential nonlinearity; digital circuit; power 0.44 mW; size 65 nm; time-to-digital converter; voltage 1.2 V; word length 9 bit; CMOS integrated circuits; Delays; Inverters; Logic gates; Propagation delay; Signal resolution; Transistors;
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
DOI :
10.1109/ISCAS.2015.7168967