DocumentCode :
72724
Title :
Stochastic Analysis of Wideband Near-Field Emissions From Dipole Antennas and Integrated Circuits
Author :
Arnaut, L.R. ; Obiekezie, C.S.
Author_Institution :
George Green Inst. of Electromagn. Res., Univ. of Nottingham, Nottingham, UK
Volume :
56
Issue :
1
fYear :
2014
fDate :
Feb. 2014
Firstpage :
93
Lastpage :
101
Abstract :
A statistical method is developed for characterizing wideband emissions from planar antennas and circuits containing multiple radiating elements. It is shown how the space-time and space-frequency correlation functions for source currents can be deduced from near-field measurements. These correlations produce additional spectral distortion of the emitted near field, over and above the far-field spectra of individual elements and their combined spectrum for uncorrelated sources. For an arbitrary configuration and number of emitting dipoles, the contribution to this distortion by pairwise correlations is fully calculable from the second-order covariance theory. Simulation results for a 2 ×2 dipole array and near-field measurements on an L-shaped microstrip antenna with wide-band excitation demonstrate and validate the feasibility of the method and the theoretically predicted spectral distortion based on pairwise correlations only.
Keywords :
ULSI; dipole antenna arrays; distortion; electromagnetic field theory; planar antenna arrays; statistical analysis; stochastic processes; L-shaped microstrip antenna; ULSI; dipole antenna array; emitting dipole number; far-field spectra; integrated circuits; multiple radiating elements; near-field measurements; pairwise correlations; planar antennas; second-order covariance theory; source currents; space-frequency correlation functions; space-time correlation functions; spectral distortion; statistical method; stochastic analysis; wideband excitation; wideband near-field emissions; Correlation; Distortion measurement; Integrated circuit modeling; Interference; Noise measurement; Stochastic processes; Circular fields; correlation analysis; near-field coherence; signal integrity; spectral distortion; stochastic electromagnetic fields;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2013.2273737
Filename :
6575113
Link To Document :
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