• DocumentCode
    727251
  • Title

    An integrated circuit solution of thermal noise thermometer with cascaded pre-amplifier and 6-bit resolution analog-to-digital converter

  • Author

    Xu Zhang ; Degang Chen

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
  • fYear
    2015
  • fDate
    24-27 May 2015
  • Firstpage
    2221
  • Lastpage
    2224
  • Abstract
    A solution of thermal noise thermometer in integrated circuit (IC) is presented in this paper. By limiting the dynamic range and bringing in IC solution, bottlenecks of high resolution and high speed requirements are broken. In this design, a multi-stage pre-amplifier is added to magnify the noise and predictions of output noise power from different sources are given after mathematical analysis. Consequently, the design conditions of the amplifier for maintaining the thermometers accuracy are generated. A 6-bit resolution analog-to-digital converter will be used to sample the signal and statistical theories are explored to develop methods which help acquire power and temperature information from the sampled codes. The design concepts are eventually verified by simulations. After one-point calibration at 27°C, the integral non-linearity of this method is 0.59°C over a temperature range from -40°C to 105°C.
  • Keywords
    analogue-digital conversion; integrated circuit measurement; integrated circuit noise; mathematical analysis; preamplifiers; temperature measurement; thermal noise; thermometers; IC; analog-to-digital converter; cascaded pre-amplifier; integrated circuit solution; mathematical analysis; multistage pre-amplifier; temperature 0.59 degC; temperature 27 degC; temperature 40 degC to 105 degC; thermal noise thermometer; Noise; Noise measurement; Resistors; Temperature measurement; Temperature sensors; Thermal noise; industrial temperature range; multi-stage preamplifier; thermal noise thermometer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
  • Conference_Location
    Lisbon
  • Type

    conf

  • DOI
    10.1109/ISCAS.2015.7169123
  • Filename
    7169123