DocumentCode :
727255
Title :
A subthreshold, low-power, RHBD reference circuit, for earth observation and communication satellites
Author :
Andreou, Charalambos M. ; Paccagnella, Alessandro ; Gonzalez-Castano, Diego M. ; Gomez, Faustino ; Liberali, Valentino ; Prokofiev, Alexander V. ; Calligaro, Cristiano ; Javanainen, Arto ; Virtanen, Ari ; Nahmad, Daniel ; Georgiou, Julius
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Cyprus, Nicosia, Cyprus
fYear :
2015
fDate :
24-27 May 2015
Firstpage :
2245
Lastpage :
2248
Abstract :
A low-power, wide temperature range, radiation tolerant CMOS voltage reference is presented. The proposed reference circuit exhibits a voltage deviation of 0.8mV for 3-MeV protons total ionization dose of 2Mrad and a voltage deviation of 3.8mV for 10-keV X-rays total ionization dose of 4Mrad while being biased at the nominal supply voltage of 0.75V during X-ray irradiation. In addition, the circuit consumes only 4μW and exhibits a measured Temperature Drift of 15ppm/°C for a temperature range of 190°C (-60°C to 130°C) at the supply voltage of 0.75V. It utilizes only CMOS transistors, operating in the subthreshold regime, and poly-silicon resistors without using any diodes or external components such as compensating capacitors. The circuit is radiation hardened by design (RHBD), it was fabricated using TowerJazz Semiconductor´s 0.18μm standard CMOS technology and occupies a silicon area of 0.039mm2. The proposed voltage reference is suitable for high-precision and low-power space applications.
Keywords :
CMOS integrated circuits; ionisation; radiation hardening (electronics); reference circuits; satellite communication; CMOS transistors; RHBD reference circuit; X-rays total ionization dose; communication satellites; earth observation; polysilicon resistors; power 4 muW; radiation hardened by design; radiation tolerant CMOS voltage reference; size 0.039 mm; size 0.18 mum; temperature 60 degC to 130 degC; temperature drift; towerjazz semiconductor; voltage 0.75 V; voltage 0.8 mV; voltage 3.8 mV; voltage deviation; CMOS integrated circuits; Photonic band gap; Radiation effects; Temperature distribution; Temperature measurement; Threshold voltage; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
Type :
conf
DOI :
10.1109/ISCAS.2015.7169129
Filename :
7169129
Link To Document :
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