DocumentCode :
727310
Title :
A novel yield aware multi-objective analog circuit optimization tool
Author :
Berkol, Gonenc ; Afacan, Engin ; Dundar, Gunhan ; Pusane, Ali Emre ; Baskaya, Faik
Author_Institution :
Dept. of Electr. & Electron. Eng., Bogazici Univ., Istanbul, Turkey
fYear :
2015
fDate :
24-27 May 2015
Firstpage :
2652
Lastpage :
2655
Abstract :
This paper proposes a novel multi-objective yield aware analog sizing tool that utilizes scrambled Quasi Monte Carlo (QMC) approach for efficient yield estimation and Strength Pareto Evolutionary Algorithm-2 (SPEA2) as a search engine. Analog circuit sizing tools have been utilized for the last two decades to overcome challenging trade-offs in analog circuit design. However, due to the variation phenomenon, some solutions at the Pareto front (PF) move towards the suboptimal region. To overcome this issue, yield aware optimization tools, where yield is given as a new design objective, have been proposed in the last decade. Conventionally, Monte Carlo (MC) approach has been used for the yield estimation. However, large sized MC analysis is a highly inefficient and time consuming process because of the numerous simulations performed during the optimization process. Rather than conventional MC, using QMC, which utilizes Low Discrepancy Sequences (LDS), enhances the synthesis time since, it promises low estimation errors with fewer number of simulations. Thanks to the QMC based variability analysis and multi-objective search engine, a yield aware PF that allows the designer to access all robust solutions can be obtained within an acceptable synthesis time.
Keywords :
Monte Carlo methods; analogue circuits; circuit optimisation; integrated circuit yield; Pareto front; analog circuit design; low discrepancy sequences; multi-objective search engine; quasi Monte Carlo; strength Pareto evolutionary algorithm-2; variability analysis; yield aware multi-objective analog circuit optimization tool; yield estimation; Analog circuits; Estimation error; Optimization; Sociology; Statistics; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
Type :
conf
DOI :
10.1109/ISCAS.2015.7169231
Filename :
7169231
Link To Document :
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