Title :
STT-RAM write energy consumption reduction by differential write termination method
Author :
Farkhani, Hooman ; Peiravi, Ali ; Madsen, Jens K. ; Moradi, Farshad
Author_Institution :
Dept. of Electr. Eng., Ferdowsi Univ. of Mashhad, Mashhad, Iran
Abstract :
Spin-transfer torque random access memory (STT-RAM) has emerged as an attractive candidate for future non-volatile memories. However, the write operation in 1T-1MTJ STT-RAM bit-cells is asymmetric and stochastic which leads to high energy consumption and long latency. In this paper, a new write assist technique is proposed to terminate the write operation immediately after switching takes place in the MTJ. As a result, both write time and write power of 1T-1MTJ bit-cells improve. Moreover, the proposed write assist technique is robust in the presence of process variations. Simulation results using 65nm CMOS access transistor and 40-nm magnetic tunneling junction technology confirm that the proposed write assist technique results in three orders of magnitude improvement in bit error rate compared with the best existing techniques. Moreover, the proposed write assist technique leads to 81% power savings compared with a cell without write assist.
Keywords :
CMOS memory circuits; energy consumption; error statistics; magnetic tunnelling; random-access storage; 1T1MTJ STT-RAM bit-cell; CMOS access transistor; bit error rate; complementary metal oxide semiconductor; differential write termination method; magnetic tunneling junction technology; nonvolatile memory; power saving; size 40 nm; size 65 nm; spin-transfer torque random access memory; write assist technique; write energy consumption reduction; Bit error rate; Discrete wavelet transforms; Magnetic tunneling; Switches; Switching circuits; Transistors; Writing; STT-RAM; bit error rate; high speed; low power; write termination;
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
DOI :
10.1109/ISCAS.2015.7169302