Title :
A calibration technique for SAR analog-to-digital converter based on INL testing with quantization bits and redundant bit
Author :
Xu Zhang ; Chongli Cai ; Hao Meng ; Sudani, Siva ; Geiger, Randall ; Degang Chen
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
A calibration technique for SAR analog-to-digital converters is proposed in this paper which is ready to be integrated on chip. This technique is based on the integral nonlinearity (INL) test and utilizes one redundant bit and extra two quantization bits to improve the calibration accuracy. In the calibration mode, mismatch errors are saved as higher-bit level INL information and then translated to calibration codes. During the conversion, higher-bit level outputs are adjusted and truncated to generate the required bits. Finally, 0.375LSB improvement of INL is observed by theoretical analysis and the effectiveness of this method is verified by simulations in which the maximum INL is reduced from 0.9LSB to 0.23LSB.
Keywords :
analogue-digital conversion; calibration; integrated circuit testing; INL testing; SAR ADC; analog-digital converter; calibration codes; calibration technique; integral nonlinearity test; quantization bits; redundant bits; Accuracy; Analog-digital conversion; Built-in self-test; Calibration; Capacitors; Quantization (signal); Redundancy; SAR analog-to-digital converter; quantization bits; redundant bit; self-calibration;
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
DOI :
10.1109/ISCAS.2015.7169324
