Title :
CDVS feature selection on embedded systems
Author :
Garbo, A. ; Loiacono, C. ; Quer, S. ; Balestri, M. ; Francini, G.
Author_Institution :
Dipt. di Autom. ed Inf., Politec. di Torino Turin, Turin, Italy
fDate :
June 29 2015-July 3 2015
Abstract :
Mobile image retrieval and pairwise matching applications pose a unique set of challenges. As communicating large amount of data could take tens of seconds over a slow wireless link, MPEG defined the CDVS standard to transfer over the network only the data essential to the matching, and not the entire image. However, the extraction of salient image features is a very time consuming process, and it may still require times in the order of seconds when running on CPU of modern mobile devices. To reduce feature extraction computation times, we re-design the MPEG-CDVS feature selection algorithm for highly parallel embedded GPUs. We consider two different approaches compliant to the standard. In the first one, feature selection is performed before the orientation assignment stage. In the second one, it is performed after. We present a complete experimental analysis on a large test set. Our experiments show that our GPU-based approaches are remarkably faster than the CPU-based reference implementation of the standard, while maintaining a comparable precision in terms of true and false positive rates. To sum up, our solutions have been proved to be effective for real-time applications running on modern embedded systems.
Keywords :
embedded systems; feature extraction; feature selection; graphics processing units; image coding; image matching; image retrieval; mobile computing; parallel processing; MPEG-CDVS feature selection algorithm; embedded systems; mobile image retrieval; orientation assignment stage; pairwise matching application; parallel embedded GPUs; salient image feature extraction; wireless link; Accuracy; Feature extraction; Graphics processing units; Histograms; Kernel; Standards; Transform coding;
Conference_Titel :
Multimedia & Expo Workshops (ICMEW), 2015 IEEE International Conference on
Conference_Location :
Turin
DOI :
10.1109/ICMEW.2015.7169789