DocumentCode :
727481
Title :
Light field depth estimation exploiting linear structure in EPI
Author :
Huijin, L.V. ; Gu, Kaiyu ; Yongbing Zhang ; Qionghai Dai
Author_Institution :
Grad. Sch. at Shenzhen, Tsinghua Univ., Shenzhen, China
fYear :
2015
fDate :
June 29 2015-July 3 2015
Firstpage :
1
Lastpage :
6
Abstract :
Light field (LF), a promising representation to describe the visual appearance of a scene, implicitly captures 3D scene geometry. Inspired by this, we exploit the special linear structure of epipolar plane image (EPI) and propose a novel framework for depth estimation for 4D LF. Our approach estimates disparities through locating the optimal slope of each line segmentation on EPIs, which are projected by corresponding scene points. For each pixel to be processed, we employ intensity pixel value, gradient pixel value, spatial consistency as well as reliability measure to select the best slope from a predefined set. The depth value is calculated according to the geometric relation between disparity and slope of line segmentation in EPI. Then a novel method to detect and handle occlusion boundaries is introduced, further improving the quality of depth maps. We test our algorithm on not only a number of synthetic LF examples but real-world LF datasets, and the experimental results show that our technique outperforms both the state-of-the art and the recent light field stereo matching methods, especially near occlusion boundaries.
Keywords :
computational geometry; estimation theory; image matching; image segmentation; stereo image processing; 3D scene geometry; EPI; depth map; epipolar plane image; geometric relation; gradient pixel value; intensity pixel value; light field depth estimation; line segmentation; linear structure; occlusion boundary; optimal slope; predefined set; real-world LF dataset; reliability measure; spatial consistency; stereo matching method; visual appearance; Cameras; Computer vision; Estimation; Image edge detection; Optimization; Three-dimensional displays; Visualization; Light field; depth estimation; epipolar plane image (EPI); occlusion detection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia & Expo Workshops (ICMEW), 2015 IEEE International Conference on
Conference_Location :
Turin
Type :
conf
DOI :
10.1109/ICMEW.2015.7169836
Filename :
7169836
Link To Document :
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