DocumentCode
72777
Title
Electrically Trimmable Phase Change Ge2Sb2Te5 Resistors With Tunable Temperature Coefficient of Resistance
Author
Privitera, S. ; D´Arrigo, G. ; Mio, A.M. ; Piluso, N. ; La Via, F. ; Rimini, E.
Author_Institution
Inst. of Microelectron. & Microsyst., Catania, Italy
Volume
61
Issue
8
fYear
2014
fDate
Aug. 2014
Firstpage
2879
Lastpage
2885
Abstract
Electrically trimmable resistors have been manufactured using the phase change alloy Ge2Sb2Te5. High resistivity values (about 1 mΩ cm) and almost zero temperature coefficient of resistance (TCR) have been obtained using resistors with hcp phase of metallic behavior and converting a small region of the film into the fcc phase, with opposite trend of resistance versus temperature. The conversion into the fcc phase has been obtained through two electric pulses, the first for melting and quenching in the amorphous phase and the second for crystallization in the fcc semiconductive phase. Theoretical considerations together with the experimental measurements allow to determine the proper ratio between the metallic and the semiconductive phase required to obtain a target resistance and temperature dependence. For example, a resistor almost independent on the temperature can be achieved by electrical trimming, increasing the resistance of about 10% of the initial value. The resistor layout has been optimized through electro-thermal simulations, to achieve the modification of the resistors structure only in a confined region. Experimental results confirm the theoretical expectations and demonstrate that phase change materials can be effectively used to obtain reversible electrically trimmable resistors with adjustable TCR.
Keywords
antimony alloys; crystallisation; germanium alloys; melting; phase change materials; tellurium alloys; thermal resistance; thin film resistors; Ge2Sb2Te5; TCR; amorphous phase; electric pulses; electrically trimmable phase change resistors; electro-thermal simulations; melting; metallic behavior; phase change alloy; phase change materials; quenching; resistor layout; semiconductive phase; temperature dependence; thin film resistors; tunable temperature coefficient of resistance; Annealing; Conductivity; Crystallization; Electrical resistance measurement; Resistance; Resistors; Temperature measurement; Electrical trimming; high precision; temperature coefficient of resistance (TCR); thin film resistors; thin film resistors.;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2014.2330457
Filename
6845323
Link To Document