• DocumentCode
    728083
  • Title

    Error bound and simulation algorithm for piecewise deterministic approximations of stochastic reaction systems

  • Author

    Ganguly, Arnab ; Altintan, Derya ; Koeppl, Heinz

  • Author_Institution
    Dept. of Math., Univ. of Louisville, Louisville, KY, USA
  • fYear
    2015
  • fDate
    1-3 July 2015
  • Firstpage
    787
  • Lastpage
    792
  • Abstract
    In cellular reaction systems, events often happen at different time and abundance scales. It is possible to simulate such multi-scale processes with exact stochastic simulation algorithms, but the computational cost of these algorithms is prohibitive due to the presence of high propensity reactions. This observation motivates the development of hybrid models and simulation algorithms that combine deterministic and stochastic representation of biochemical systems. Based on the random time change model we propose a hybrid model that partitions the reaction system into fast and slow reactions and represents fast reactions through ordinary differential equations (ODEs) while the Markov jump representation is retained for slow ones. Importantly, the partitioning is based on an error analysis which is the main contribution of the paper. The proposed error bound is then used to construct a dynamic partitioning algorithm. Simulation results are provided for two elementary reaction systems.
  • Keywords
    Markov processes; biochemistry; differential equations; error analysis; stochastic systems; Markov jump representation; ODE; biochemical systems; cellular reaction systems; dynamic partitioning algorithm; elementary reaction systems; error analysis; error bound; hybrid model; ordinary differential equations; piecewise deterministic approximations; random time change model; simulation algorithm; stochastic reaction systems; Approximation algorithms; Approximation methods; Biological system modeling; Computational modeling; Heuristic algorithms; Mathematical model; Partitioning algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2015
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4799-8685-9
  • Type

    conf

  • DOI
    10.1109/ACC.2015.7170830
  • Filename
    7170830