• DocumentCode
    728459
  • Title

    On frequency response analysis of GPIO

  • Author

    Zhang Chao ; Zhu Jihong

  • Author_Institution
    Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
  • fYear
    2015
  • fDate
    1-3 July 2015
  • Firstpage
    3944
  • Lastpage
    3949
  • Abstract
    The Generalized Proportional Integral Observer (GPIO), which is a generalized high order Extended State Observer (ESO), has drawn much attention from both the industry and academia recently. This paper explores the characteristics of GPIO for the linear, time-invariant (LTI) plants using the frequency response method. It shows that the high order GPIO not only estimates the total disturbance and its derivatives, but also contributes to the closed-loop system type. Theoretical analysis and simulation results agree in that different GPIO orders have little impact on the tracking performances and the control signal, but more augmented state variables in the GPIO can lead to stronger disturbance rejection and smaller sensitivity function, at the cost of decreasing stability margins, increasing sensitivity to measurement noises and increasing the computational complexity. The conclusions could be useful for the practitioners and researchers who need clarity in the GPIO order selections.
  • Keywords
    PI control; closed loop systems; computational complexity; frequency response; linear systems; observers; stability; ESO; GPIO order selections; LTI; augmented state variables; closed-loop system type; computational complexity; decreasing stability margins; disturbance rejection; extended state observer; frequency response analysis; frequency response method; generalized proportional integral observer; linear time-invariant plants; measurement noises; sensitivity function; Control systems; Frequency-domain analysis; Mathematical model; Noise; Observers; Sensitivity; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2015
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4799-8685-9
  • Type

    conf

  • DOI
    10.1109/ACC.2015.7171945
  • Filename
    7171945