DocumentCode :
728503
Title :
Development of a stereo imaging system for three-dimensional shape measurement of crystals
Author :
Ma, Cai Y. ; Liu, Jing J. ; Tao Liu ; Wang, Xue Z.
Author_Institution :
Sch. of Process, Environ. & Mater. Eng., Univ. of Leeds, Leeds, UK
fYear :
2015
fDate :
1-3 July 2015
Firstpage :
4288
Lastpage :
4294
Abstract :
Despite the availability of various Process Analytical Technologies (PAT) for measuring other particle properties, their inherit limitations for the measurement of crystal shape have been restricted. This has impacted, in turn, on the development and implementation of optimisation, monitoring and control of crystal shape and size distributions within particle formulation and processing systems In recent years, imaging systems have shown to be a very promising PAT technique for the measurement of crystal growth, but still essentially limited as a technique only to provide two-dimensional information. The idea of using two synchronized cameras to obtain 3D crystal shape was mentioned previously (Chem Eng Sci 63(5) 1171-1184, 2008) but no quantitative results were reported. In this paper, a methodology which can directly image the full three-dimensional shape of crystals has been developed. It is based on the mathematical principle that if the two-dimensional images of an object are obtained from two different angles, the full three-dimensional crystal shape can be reconstructed. A proof of concept study has been carried out to demonstrate the potentials in using the system for the three-dimensional measurement of crystals.
Keywords :
chemistry computing; crystals; image reconstruction; stereo image processing; 2D images; 3D crystal shape reconstruction; PAT; crystal 3D shape measurement; process analytical technologies; stereo imaging system; Cameras; Crystals; Image edge detection; Image reconstruction; Shape; Three-dimensional displays; Crystal shape; Image analysis; Stereo imaging; Three-dimensional shape reconstruction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference (ACC), 2015
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4799-8685-9
Type :
conf
DOI :
10.1109/ACC.2015.7172003
Filename :
7172003
Link To Document :
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