DocumentCode
728700
Title
Evaluation of oxygen vacancy in ZnO using Raman spectroscopy
Author
Fukushima, Hiroaki ; Kozu, Tomomi ; Shima, Hiromi ; Funakubo, Hiroshi ; Uchida, Hiroshi ; Katoda, Takashi ; Nishida, Ken
Author_Institution
Dept. of Commun. Eng., Nat. Defense Acad., Yokosuka, Japan
fYear
2015
fDate
24-27 May 2015
Firstpage
28
Lastpage
31
Abstract
Oxygen vacancies in zinc oxide (ZnO) are intrinsic defects, which are easily generated during crystal growth or device processing. Investigations of defects, such as oxygen vacancies, are important to understand the properties of ZnO. In this study, we attempt to quantify oxygen vacancies in ZnO powders using Raman spectroscopy. ZnO powder is reduced in a hydrogen atmosphere at 300-600 °C for 30-90 min. The peak position of the E2(high) mode, which is related to the oxide ion vibration, shifts toward a lower frequency as the oxygen vacancies increase. Upon re-oxidation, the initial E2(high) peak position is restored. Because the E2(high) peak shift is scaled with the amount of oxygen vacancies, this relationship can be used to estimate the amount of oxygen vacancies.
Keywords
II-VI semiconductors; Raman spectra; oxidation; powders; reduction (chemical); vacancies (crystal); vibrations; wide band gap semiconductors; zinc compounds; Raman spectroscopy; ZnO; crystal growth; device processing; hydrogen atmosphere; intrinsic defects; oxide ion vibration; oxygen vacancy evaluation; reoxidation; temperature 300 degC to 600 degC; time 30 min to 90 min; zinc oxide powders; Atmosphere; II-VI semiconductor materials; Phonons; Powders; Raman scattering; Zinc oxide; Oxygen vacancy; Raman spectroscopy; Re-oxidized treatment; Reduced treatment; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectric, International Symposium on Integrated Functionalities and Piezoelectric Force Microscopy Workshop (ISAF/ISIF/PFM), 2015 Joint IEEE International Symposium on the
Conference_Location
Singapore
Type
conf
DOI
10.1109/ISAF.2015.7172660
Filename
7172660
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