DocumentCode :
728785
Title :
P-channel oxide thin film transistors using sol-gel solution processed nickel oxide
Author :
Tengda Lin ; Xiuling Li ; Jin Jang
Author_Institution :
Dept. of Inf. Display, Kyung Hee Univ., Seoul, South Korea
fYear :
2015
fDate :
1-4 July 2015
Firstpage :
129
Lastpage :
130
Abstract :
Nickel oxide (NiO) thin film was synthesized on glass substrate by low-cost sol-gel solution process at 300 °C under ambient condition. The optical properties confirmed the high transparency over visible region and estimated optical band gap of 3.53 eV. Bottom-gate top-contact thin film transistors (TFTs) employing NiO film as active layer were fabricated via conventional photolithography. The electrical property of the NiO TFTs exhibited p-channel operation and field effect mobility of 0.077 cm2/V·s. This work reported the potential of NiO TFTs with p-channel characteristics using easily accessed solution process.
Keywords :
energy gap; nickel compounds; optical properties; photolithography; sol-gel processing; thin film transistors; visible spectra; NiO; TFT; active layer; ambient condition; bottom-gate top-contact thin film transistors; field effect mobility; glass substrate; low-cost sol-gel solution process; nickel oxide thin film; optical band gap; optical properties; p-channel oxide thin film transistors; photolithography; temperature 300 degC; visible region; Glass; Logic gates; Nickel; Optical device fabrication; Optical films; Photonic band gap; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2015 22nd International Workshop on
Conference_Location :
Kyoto
Type :
conf
DOI :
10.1109/AM-FPD.2015.7173218
Filename :
7173218
Link To Document :
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