Title :
Nanocrystallized CdS for detection of UV light with picowatt sensitivity through single shot KrF laser treatment
Author :
Keng-Te Lin ; Hsuen-Li Chen ; Yu-Lun Liu ; Yi-Chuan Tseng ; Cheng-Hsi Lin ; Ho-Ming Chang ; Jui-Min Liu ; Yu-Sheng Lai
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
In this study we demonstrated that the improvement of detection capability of cadmium sulfide (CdS) photoconductors in the ultraviolet (UV) regime is much larger than that in the visible regime, suggesting that the deep UV laser treated CdS devices are very suitable for low-light detection in the UV regime. In addition, we determined that a nanocrystallized CdS photoconductor can behave as a picowatt-sensitive detector in the UV regime after ultra-shallow-region crystallization of the CdS film upon a single shot from a KrF laser. The strategy proposed herein appears to have great potential for application in the development of CdS photoconductors for picowatt-level detection of UV light with low power consumption.
Keywords :
II-VI semiconductors; cadmium compounds; level measurement; nanosensors; nanostructured materials; optical sensors; photoconducting materials; photodetectors; ultraviolet detectors; wide band gap semiconductors; CdS; UV light detection; cadmium sulfide; deep UV laser treatment; nanocrystallized CdS photoconductor; picowatt-level detection; picowatt-sensitive detector; power consumption; single shot KrF laser treatment; ultrashallow-region crystallization; ultraviolet light detection; Crystallization; Density measurement; Films; Photoconducting materials; Power system measurements; Surface treatment; Wavelength measurement;
Conference_Titel :
Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2015 22nd International Workshop on
Conference_Location :
Kyoto
DOI :
10.1109/AM-FPD.2015.7173247