RadFET Dosimeters in the Belt: the Van Allen Probes on Day 365

Author

Holmes-Siedle, A.G. ; Goldsten, J.O. ; Maurer, R.H. ; Peplowski, P.N.

Author_Institution

REM Oxford Ltd., Oxford, UK

Volume

61

Issue

2

fYear

2014

fDate

Apr-14

Firstpage

948

Lastpage

954

Abstract

Van Allen Probes A and B, launched more than a year ago (in August 2012), carried 16 p-channel metal-oxide-semiconductor Radiation-sensitive Field Effect Transistors (RadFET)s into an orbit designed by NASA to probe the heart of the trapped-radiation belts. Nearly 350 days of in situ measurements from the Engineering Radiation Monitor (ERM) (1) demonstrated strong variations of dose rates with time, (2) revealed a critical correlation between the ERM RadFET dosimeters and the ERM Faraday cup data on charged particles, and (3) permitted the mapping of the belts by measuring variation with orbit altitude. This paper provides an update on early results given in a NSREC2012 paper along with details and discussion of the RadFET dosimetry data analyzed .

Keywords

MOSFET; atmospheric measuring apparatus; dosimeters; dosimetry; radiation belts; ERM Faraday cup data; ERM RadFET dosimeters; Engineering Radiation Monitor; NASA; NSREC2012 paper; RadFET dosimetry data; Van Allen Probe A; Van Allen Probe B; charged particles; dose rates; orbit altitude; p-channel metal-oxide-semiconductor radiation-sensitive field effect transistors; trapped-radiation belts; Belts; Calibration; Extraterrestrial measurements; Orbits; Probes; Radiation effects; Space vehicles; Detectors; RadFET; Van Allen Probes; dosimetry; radiation damage; radiation environment; radiation hardening; spacecraft dielectric charging currents;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2014.2307012

Filename

6786389