DocumentCode :
728884
Title :
GRT at the SBST 2015 Tool Competition
Author :
Lei Ma ; Artho, Cyrille ; Cheng Zhang ; Sato, Hiroyuki ; Hagiya, Masami ; Tanabe, Yoshinori ; Yamamoto, Mitsuharu
Author_Institution :
Univ. of Tokyo, Tokyo, Japan
fYear :
2015
fDate :
18-19 May 2015
Firstpage :
48
Lastpage :
51
Abstract :
GRT (Guided Random Testing) is an automatic test generation tool for Java code, which leverages static and dynamic program analysis to guide run-time test generation. In this paper, we summarize competition results and experiences of GRT in participating in SBST 2015, where GRT ranked first with a score of 203.73 points over 63 Java classes from 10 packages of 9 open-source software projects.
Keywords :
Java; automatic testing; program diagnostics; public domain software; GRT; Java code; SBST 2015 Tool Competition; Search-based Software Testing; automatic test generation tool; dynamic program analysis; guided random testing; open-source software projects; run-time test generation; static program analysis; Benchmark testing; Impurities; Java; Manuals; Protocols; Software; Software testing; automatic test case generation; program analysis; random testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Search-Based Software Testing (SBST), 2015 IEEE/ACM 8th International Workshop on
Conference_Location :
Florence
Type :
conf
DOI :
10.1109/SBST.2015.19
Filename :
7173592
Link To Document :
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